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Automatika
Journal for Control, Measurement, Electronics, Computing and Communications
Volume 65, 2024 - Issue 3
Regular Paper
Deep neural network-based emotion recognition using facial landmark features and particle swarm optimization
S. VaijayanthiDepartment of Computer Science and Engineering, SRM Institute of Science and Technology, Vadapalani Campus, Chennai, IndiaCorrespondence[email protected]
https://orcid.org/0000-0002-1959-7906
https://orcid.org/0000-0002-1959-7906 & J. ArunnehruDepartment of Computer Science and Engineering, SRM Institute of Science and Technology, Vadapalani Campus, Chennai, Indiahttps://orcid.org/0000-0002-2245-5001
https://orcid.org/0000-0002-2245-5001