Optimal double acceptance sampling plans based on truncated life tests for Tsallis q-exponential distributions

Abstract

Optimal double sampling plans for lot acceptance based on truncated life tests are derived by minimizing the expected sample size when the lifetime variable follows a Tsallis q-exponential distribution. The proposed test plans significantly reduce the inspection effort with respect to the best single sampling schemes. Some tables and figures are presented to analyze the behavior of the suggested test plans. The results show that the proposed lot inspection scheme clearly outperforms the standard single sampling plan. A justification is provided using a comparative study for existing double sampling plans. Finally, several applications are provided for illustrative purposes.

Keywords:

• Double acceptance sampling plan
• consumer's and producer's risk
• Tsallis q-exponential distribution
• operating characteristic function
• time truncated life tests

Acknowledgments

The authors thank the Editor and Reviewers for providing valuable comments and suggestions.

Disclosure statement

No potential conflict of interest was reported by the author(s).

Additional information

Funding

This work of the first author has been supported by a research grant from the University of Mazandaran. The work of the second author was partially supported by MCIN/AEI/10.13039/501100011033 under grant PID2019-110442GB-I00.