53
Views
1
CrossRef citations to date
0
Altmetric
Articles

Crack formation and optical properties in 175 MeV Au13+ ion beam irradiated CeO2 thin films

, &
Pages 1372-1383 | Received 06 Apr 2023, Accepted 26 Aug 2023, Published online: 04 Sep 2023

References

  • Murugadoss, G.; Kumar, D.D.; Kumar, M.R.; Venkatesh, N.; Sakthivel, P. Sci. Rep 2021, 11, 1080.
  • Li, W.; Shi, J.; Zhang, K.H.L.; MacManus-Driscoll, J.L. Mater. Horiz 2020, 7, 2832–2859.
  • Hosono, H. Nat. Electron 2018, 1, 428.
  • Park, H.H.; Kang, P.S.; Kim, G.T.; Ka, J.S. Appl. Phys. Lett 2010, 96, 102908.
  • Li, Y.; Fu, J.; Mao, X.; Chen, C.; Liu, H.; Gong, M.; Zeng, H. Nat. Commun. 2021, 12, 5896.
  • Saruhan, B.; Fomekong, R.L.; Nahirniak, S. Front. Sens 2021, 2, 657931.
  • Chowdhury, N.K.; Bhowmik, B. Nanoscale Adv 2021, 3, 73–93.
  • Potyrailo, R.A.; Go, S.; Sexton, D.; Li, X.; Alkadi, N.; Kolmakov, A.; Amm, B.; St-Pierre, R.; Scherer, B.; Nayeri, M.; Wu, G.; Collazo-Davila, C.; Forman, D.; Calvert, C.; Mack, C.; McConnell, P. Nat. Elect 2020, 3, 280–289.
  • Yang, S.; Wang, Z.; Hu, Y.; Cai, Y.; Huang, R.; Li, X.; Huang, Z.; Lan, Z.; Chen, W.; Gu, H. Sens Actuator B-Chem 2018, 260, 21–32.
  • Baudet, E.; Sergent, M.; Němec, P.; Cardinaud, C.; Rinnert, E.; Michel, K.; Jouany, L.; Bureau, B.; Nazabal, V. Sci. Repo 2017, 7, 3500.
  • Ahmed, A.; Han, S. Sci. Repo 2020, 10, 6978.
  • Hong, N.H.; Poirot, N.; Sakai, J. Phys. Rev. B 2008, 77, 033205.
  • Zhang, L.; Ge, S.; Zoo, Y.; Zhou, X.; Xiao, Y.; Yan, S.; Han, X.; Wen, Z. J. Appl. Phys 2008, 104, 123909.
  • Fitzgerald, C.B.; Venkatesan, M.; Dorneles, L.S.; Gunning, R.; Stamenov, P.; Coey, J.M.D.; Stampe, P.A.; Kennedy, R.J.; Moreira, E.C.; Sias, U.S. Phys. Rev. B 2006, 74, 115307.
  • Wu, X.; Wei, Z.; Zhang, L.; Wang, X.; Yang, H.; Jiang, J. J. Nanomater 2014, 1, 792102.
  • Wang, L.; Zhang, F.; Chen, S.; Bai, Z. Int. J. Miner. Metall. Mater 2017, 24, 455–461.
  • Sajjad, M.; Ullah, I.; Khan, M.I.; Khan, J.; Khan, M.Y.; Quresi, M.T. Res. Phys 2018, 9, 1301.
  • Murali, A.; Sarswat, P.K.; Sohn, H.Y. Mater. Today Chem 2019, 11, 60–68.
  • Al-Shomar, S.M. Mat. Res. Express 2020, 7, 036409.
  • Maheswari, S.; Karunakaran, M.; Annalakshmi, V.; Kasirajan, K. Res. Mater 2020, 8, 100130.
  • Sharma, A.; Verma, K.D.; Varshney, M.; Singh, D.; Singh, M.; Asokan, K.; Kumar, R. Radiat. Eff. Defects Solids 2010, 165, 930–937.
  • Sharma, A.; Verma, K.D.; Varshney, M.; Singh, A.P.; Kumar, Y.; Srivastava, S.; Vijay, Y.K.; Asokan, K.; Choudhary, R.J.; Kumar, R. Adv. Sci. Lett 2011, 4, 501–507.
  • Negi, D.; Shyam, R.; Vashishtha, P.; Gupta, G.; Singh, F.; Nelamarri, S.R.; Lumines, J. 2022, 249, 119051.
  • Singh, J.P.; Kaur, B.; Sharma, A.; Kim, S.H.; Gautam, S.; Srivastava, R.C.; Goyal, N.; Lim, W.C.; Lin, H.J.; Chen, J.M.; Asokan, K.; Kanjilal, D.; Ok Won, S.; Lee, I.J.; Chae, K.H. Phys. Chem. Chem. Phys 2018, 20, 12084–12096.
  • Kumar, R.; Chauhan, V.; Koratkar, N.; Kumar, S.; Sharma, A.; Chae, K.H.; Won, S.O. J. Alloy. Comp 2020, 831, 154698.
  • Aftab, Z.; Sulania, I.; Kandasami, A.; Nair, L. ACS Omega 2022, 7, 31869–31876.
  • Mohanty, T.; Satyam, P.V.; Kanjilal, D. J. Nanosci. Nanotechnol 2006, 6, 2554–2559.
  • Szenes, G. Phys. Rev. B 1995, 51, 8026–8029.
  • Varshney, M.; Sharma, A.; Kumar, R.; Verma, K.D. Nucl. Instr. Meth. B 2011, 269, 2786–2791.
  • Dhara, S. Crit. Rev. Solid State Mater. Sci 2007, 32, 1–50.
  • Nakajima, Y.; Tsuchiya, Y.; Taen, T.; Tamegai, T.; Okayasu, S.; Sasase, M. Phys. Rev. B 2009, 80, 012510.
  • Popel, A.J.; Le Solliec, S.; Lampronti, G.I.; Day a, J.; Petrov c, P.K.; Farnan, I. J. Nucl. Mat 2017, 484, 332–338.
  • Ziegler, J.F. Nucl. Instrum. Methods Phys. Res. B., 2003, 1027, 219–220.
  • Thakurdesai, M.; Mahadkar, A.; Kularia, P.K.; Kanjilal, D.; Bhattacharya, V. Nucl. Instr. Meth. B 2008, 266, 1343–1348.
  • Bolse, W.; Bolse, T.; Dais, C.; Debissa, D.E.; Elsanousi, A.; Feyh, A.; Kalafat, M.; Paulus, H. Surf. Coat. Technol. 2005, 200, 1430–1435.
  • Mallik, P.; Biswal, R.; Rath, C.; Agrawal, D.C.; Tripathi, A.; Avasthi, D.K.; Kanjilal, D.; Satyam, P.V.; Mishra, N.C. Nucl. Instr. Meth. B 2010, 268, 470–475.
  • Schiwietz, G.; Luderer, E.; Xiao, G.; Grande, P.L. Nucl. Instr. Meth. B 2001, 175, 1–11.
  • Thakur, H.; Sharma, K.K.; Kumar, R.; Thakur, P.; Kumar, Y.; Singh, A.P.; Gautam, S.; Chae, K.H. J. Kor. Phys. Soc 2012, 61, 1609–1614.
  • Suárez, A.L.; Acosta, D.; Magaña, C. Mater. Res. Express 2022, 9, 116403.
  • Kumar, V.; Jaiswal, M.K.; Gupta, R.; Ram, J.; Sulania, I.; Ojha, S.; Sun, X.; Koratkar, N.; Kumar, R. J. Mat. Sci. Mat. Electro 2018, 29, 13328–13336.
  • Phokaa, S.; Laokul, P.; Swatsitanga, E.; Promarak, V.; Seraphinc, S.; Maensiri, S. Mat. Chem. Phys 2009, 115, 423–428.
  • Tu, N.; Bui, H.V.; Trung, D.Q.; Duong, A.T.; Thuy, D.M.; Nguyen, D.H.; Nguyen, K.T.; Huy, P.T. J. Allo. Comp 2019, 791, 722–729.
  • Trinkus, H.; Ryazanov, A.I. Phys. Rev. Lett 1995, 74, 5072–5075.
  • Trinkus, H. Nucl. Instr. Meth. B 1998, 146, 204–216.
  • Ryazanov, A.I.; Pavlov, S.A.; Metelkin, E.V.; Zhemerev, A.V. J. Exp. Theor. Phys 2005, 101, 120–127.
  • Studer, F.; Herview, M.; Costantini, J.M.; Toulemonde, M. Nucl. Instr. Meth. B 1997, 112, 449–457.

Reprints and Corporate Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

To request a reprint or corporate permissions for this article, please click on the relevant link below:

Academic Permissions

Please note: Selecting permissions does not provide access to the full text of the article, please see our help page How do I view content?

Obtain permissions instantly via Rightslink by clicking on the button below:

If you are unable to obtain permissions via Rightslink, please complete and submit this Permissions form. For more information, please visit our Permissions help page.