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Technometrics Volume 66, 2024 - Issue 2
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Research Articles

A Graphical Multi-Fidelity Gaussian Process Model, with Application to Emulation of Heavy-Ion Collisions

Yi Jia Department of Statistical Science, Duke University, Durham, NCView further author information
,
Simon Maka Department of Statistical Science, Duke University, Durham, NCCorrespondence[email protected]
View further author information
,
Derek Soederb Department of Physics, Duke University, Durham, NCView further author information
,
J-F Paquetb Department of Physics, Duke University, Durham, NC;c Department of Physics and Astronomy & Department of Mathematics, Vanderbilt University, Nashville, TNView further author information
&
Steffen A. Bassb Department of Physics, Duke University, Durham, NCView further author information
Pages 267-281 | Received 28 Dec 2022, Accepted 30 Oct 2023, Published online: 21 Dec 2023

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