A spectral resolution of Johann-type X-ray spectrometers

Abstract

This paper presents the analysis of the geometrical components in the evaluation of the spectral resolution of X-ray bent crystal spectrometers. A toroidal Johann–Johansson type spectrometer is suggested and its resolution is estimated. Emphasis is made on the study of asymmetrically cut schemes. Generally used expansion techniques up to second order are added by calculations of the third term where second order becomes zero.

Keywords:

• X-ray
• spectroscopy
• bent crystals
• spectral resolution

Acknowledgements

The author considers it his pleasant obligation to express friendly gratitude to D.K. Vukolov, who made immense efforts in preparing the illustrative material of this article.