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Research Article

Life cycle testing and reliability analysis of prismatic lithium-iron-phosphate cells

ORCID Icon, , ORCID Icon, ORCID Icon & ORCID Icon
Article: 2337439 | Received 13 Dec 2023, Accepted 27 Feb 2024, Published online: 17 May 2024
 

ABSTRACT

A cell’s ability to store energy, and produce power is limited by its capacity fading with age. This paper presents the findings on the performance characteristics of prismatic Lithium-iron phosphate (LiFePO4) cells under different ambient temperature conditions, discharge rates, and depth of discharge. The accelerated life cycle testing results depicted a linear degradation pattern of up to 300 cycles. Linear extrapolation reveals that at 25°C temperature, an increase in the discharge rate from 0.5 C to 0.8 C reduces the cycle life significantly by 52.9%. On the other hand, at a constant discharge rate, an increase in temperature reduced predicted cycle life in the range of 23.2–41.36%. Lithium-ion cells’ reliability modeling and analysis was carried out using an exponential distribution showing the increasing failure rate with age, with the temperature significantly reducing the expected life of the cells.

Acknowledgements

The authors are thankful to the R&D support from Customized Energy Solutions Limited for support in the experimental work.

Disclosure statement

No potential conflict of interest was reported by the author(s).

Data availability statement

The authors confirm that the data supporting the findings of this study are available within the article and its supplementary materials cited within the text.

Nomenclature
Ahi=

Ampere hour charged

Aho=

Ampere hour discharged

Tc=

Charging time duration

Td=

Discharging time duration

Δt=

time step for discharge/charge

ηco=

Coulombic (Ampere-hour) efficiency

DCIR=

Direct Circuit Internal Resistance

LIB=

Lithium Ion batteries

LFP=

Lithium Iron Phosphate

OCV=

Open Circuit Voltage

Ah=

Ampere hour

DoD=

Depth of Discharge

SOC=

State of Charge

VPC=

Voltage per cell

BTS=

Battery Testing System

CTF=

Cycles-To-Failure

MCTF=

Mean-Cycle-To-Failure

CDF=

Cumulative Distribution Function

PDF=

Probability Density Function

Ic=

Charging Current

Id=

Discharging Current