Electrical detachment of triboelectrically charged bumpy particles from rough surfaces

Abstract

The detachment of bumpy particles from smooth and rough surfaces through electrostatic fields was studied. The Johnson–Kendall–Roberts (JKR) adhesion model for elastic interface deformations was used to account for the individual bump adhesion, including the electrostatic forces. It was assumed that the elastic deformation of asperities determines the real contact area, and the effect of topographic properties of substrates was included in the analysis. For a fixed charge per unit mass, the Coulomb, the image, the dielectrophoretic, and the polarization forces acting on the particle in the presence of an imposed electric field were evaluated. The electrostatic detachment of bumpy toner particles for various applied electrostatic fields was studied. The triboelectric charges were concentrated on the hemispherical bumps, and the critical electric field strength needed to detach charged particles from surfaces with varying roughness levels was evaluated. It was shown that the particle charge, surface roughness, and the number of bumps significantly affect the removal of particles from surfaces. For higher charges (∼5 × 10⁻¹⁵$C$), decreasing the number of bumps from 22 to 14 and the roughness parameter from 0.83 to 0.77 approximately doubled the detachment field needed to remove 8.3$\mu m$ polystyrene (PSL) particles from the aluminum oxide substrate. The model predictions are compared with the available experimental data, and good agreement was observed. The study’s findings predicting the electric field needed for charged particle removal could lead to more efficient copiers and electrostatic cleaning devices.

Keywords:

• Particle adhesion
• particle detachment
• electrostatic force
• surface roughness
• bumpy particles
• toner particles

Acknowledgments

The financial support of NYSTAR and Xerox Corporation through the Center for Advanced Materials Processing (CAMP) at Clarkson University is gratefully appreciated. Special thanks are given to Prof. Santokh Badesha of Purdue University (and Xerox Corporation) for many helpful suggestions.

Disclosure statement

No potential conflict of interest was reported by the authors.

Additional information

Funding

This work was supported by NYSTAR and Xerox Corporation through the Center for Advanced Materials Processing (CAMP) at Clarkson University.