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INSTRUMENTATION, METHODOLOGY, AND TECHNICAL DEVELOPMENTS

Angular Dependence of L X-Ray Differential Cross-Section for In, Sn, Sb, and Te at 5.96 keV

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Pages 593-599 | Received 02 Oct 2002, Accepted 14 Jan 2003, Published online: 24 Jun 2008
 

Abstract

The differential cross-sections of L X-ray induced in In, Sn, Sb, and Te have been measured at different angles from 94° to 170° at intervals of 9°. Measurement have been performed with a Si(Li) detector using 5.96 keV photons as the excitation source. It is seen from the results concerning heavy elements that L α peaks show anisotropic emissionn while L β and L γ peaks are emitted isotropically.

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