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Applied Artificial Intelligence
An International Journal
Volume 38, 2024 - Issue 1
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Research Article

DeFRCN-MAM: DeFRCN and multi-scale attention mechanism-based industrial defect detection method

Tong Zhenga School of Artificial Intelligence, Beijing Technology and Business University, Beijing, ChinaView further author information
,
Liangbing Saa School of Artificial Intelligence, Beijing Technology and Business University, Beijing, ChinaView further author information
,
Chongchong Yua School of Artificial Intelligence, Beijing Technology and Business University, Beijing, ChinaCorrespondence[email protected]
View further author information
&
Aibin Songb Weapons and Control Department, PLA Armored Force Academy, Beijing, ChinaView further author information
Article: 2349981 | Received 07 Dec 2022, Accepted 23 Apr 2024, Published online: 09 May 2024

References

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