7,462
Views
52
CrossRef citations to date
0
Altmetric
Original Articles

Determination of absolute quantum yields of luminescing nanomaterials over a broad spectral range: from the integrating sphere theory to the correct methodology

Pages 11-27 | Received 20 Nov 2013, Accepted 12 Jan 2014, Published online: 05 Feb 2014

References

  • Melhuish. Nomenclature, symbols, units and their usage in spectrochemical analysis: IV. Molecular luminescence spectroscopy. Pure Appl Chem. 1984;56:231–245. doi: 10.1351/pac198456020231
  • Valenta J, Fucikova A, Vácha F, Adamec F, Humpolíčková J, Hof M, Pelant I, Kůsová K, Dohnalová K, Linnros J. Light-emission performance of silicon nanocrystals deduced from the single quantum dot spectroscopy. Adv Funct Mater. 2008;18:2666–2672. doi: 10.1002/adfm.200800397
  • Demas JN, Crosby GA. The measurements of photoluminescence quantum yields. J Phys Chem. 1971;75:991–1024. doi: 10.1021/j100678a001
  • Rurack K. Fluorescence quantum yields: methods of determination and standards standardization and quality assurance in fluorescence measurements I. Techniques. In: Resch-Genger U, editor. Springer Series on Fluorescence, vol. 5. Berlin, Heidelberg: Springer; 2008. p. 101–145.
  • Würth C, Lochmann C, Spieles M, Pauli J, Hoffmann K, Schüttrigkeit T, Franzl T, Resch-Genger U. Evaluation of a commercial integrating sphere setup for the determination of absolute photoluminescence quantum yields of dilute dye solutions. Appl Spectrosc. 2010;8:733–741. doi: 10.1366/000370210791666390
  • Resch-Genger U, Rurack K. Determination of the photoluminescence quantum yield of dillute dye solutions (IUPAC technical report). Pure Appl Chem. 2013;85:2005–2026.
  • Würth C, Grabolle M, Pauli J, Spieles M, Resch-Genger U. Relative and absolute determination of fluorescence quantum yields of transparent samples. Nat Protoc. 2013;8:1535–1550. doi: 10.1038/nprot.2013.087
  • Lakowicz JR. Principles of fluorescence spectroscopy. 3rd ed. New York: Springer Science + Bussiness Media LLC; 2006.
  • Timmerman D, Valenta J, Dohnalová K, de Boer WDAM, Gregorkiewicz T. Step-like enhancement of luminescence quantum yield of silicon nanocrystals. Nat Nanotechnol. 2011;6:710–713. doi: 10.1038/nnano.2011.167
  • Feng J, Nasiatka J, Wong J, Chen X, Hidalgo S, Vecchione T, Zhu H, Javier Palomares F, Padmore HA. A stigmatic ultraviolet-visible monochromator for use with a high brightness laser driven plasma light source. Rev Sci Instrum. 2013;84:085114. doi: 10.1063/1.4817587
  • Pimputkar S, Speck JS, DenBaars SP, Nakamura S. Prospects for LED lighting. Nat Photon. 2010;3:180–182. doi: 10.1038/nphoton.2009.32
  • Pelant I, Valenta J. Luminescence spectroscopy of semiconductors. Oxford: Oxford University Press; 2012.
  • Schubert EF. Light-emitting diodes. 2nd ed. Cambridge: Cambridge University Press; 2006.
  • de Mello JC, Wittmann HF, Friend RH. An improved experimental determination of external photoluminescence quantum efficiency. Adv Mater. 1997;9:230–232. doi: 10.1002/adma.19970090308
  • McCluney WR. Introduction to radiometry and photometry. Boston, MA: Artech House; 1994.
  • Goebel DG. Generalized integrating-sphere theory. Appl Opt. 1967;6:125–128. doi: 10.1364/AO.6.000125
  • LabSphere Inc. Technical guide: integrating sphere theory and applications. LabSphere Inc. 2008. Available from: http://www.labsphere.com
  • James JF. Spectrograph design findamentals. Cambridge: Cambridge University Press; 2007.
  • Resch-Genger U, DeRose PC. Characterization of photoluminescence measuring systems (IUPAC technical reports). Pure Appl Chem. 2012;84:1815–1835. doi: 10.1351/PAC-REP-10-07-07
  • Ahn TS, Al-Kaysi RO, Müller AM, Wentz KM, Bardeen CJ. Self-absorption correction for solid-state photoluminescence quantum yields obtained from integrating sphere measurements. Rev Sci Instrum. 2007;78:086105. doi: 10.1063/1.2768926
  • Würth C, Grabolle M, Pauli J, Spieles M, Resch-Genger U. Comparison of methods and achievable uncertainties for the relative and absolute measurement of photoluminescnce quantum yields. Anal Chem. 2011;83:3431–3439. doi: 10.1021/ac2000303
  • Hartel AM, Hiller D, Gutsch S, Löper P, Estradé S, Peiró F, Garrido B, Zacharias M. Formation of size-controlled silicon nanocrystals in plasma enhanced chemical vapor deposition grown SiOxNy/SiO2 superlattices. Thin Solid Films. 2011;520:121–127. doi: 10.1016/j.tsf.2011.06.084
  • Hughes IG, Hase TPA. Measurements and their uncertainties: a practical guide to modern error analysis. Oxford: Oxford University Press; 2010.