References
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- Hua , Y.N. 1999 . Studies of EDX ZAF Quantification Method and Characterization of EDX Function in LEO 982 FESEM Equipment . The Proceedings from the SEMICON Singapore 1999-Technical Symposium . May 3–6 1999 . pp. 207 – 211 .
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- Dijkstra , J.M. and Shen , R.B. 1999 . Standardless Quantification of Conductive Oxides in the SEM 1 – 2 . the Netherlands : EDAX International . P.O. Box 4144, NL-5004 JC Tilburg
- Hans Dijkstra . Feb 1999 . EDAX Tips for EDX Users TIP NR Feb , 1 – 3 . the Netherlands EDAX Europe Ringbaan Noord 103 P.O. Box 4144, NL-5004 JC Tilburg